SEM Analysis

Piece of textile was delivered to Swerim. Following analysis was performed:

• SEM imaging from the top of sample.
• Cross section SEM and EDS analysis from the cross section after gold sputtering (2 min exposure, aiming for ~ 20 nm thick layer).
• SEM/EDS analysis were performed using Sigma 300VP SEM instrument with 6kV acceleration voltage and 300pA current.